Nonparametric Model-Based Online Junction Temperature and State-of-Health Estimation for Insulated Gate Bipolar Transistors

Nonparametric Model-Based Online Junction Temperature and State-of-Health Estimation for Insulated Gate Bipolar Transistors

Insulated gate bipolar transistor (IGBT) is widely used in power equipment, it generally works in complex circuit profiles and it is very difficult to measure or predict the thermal parameters of the module in real-time and evaluate the corresponding health status in the transient process. This pape...

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Bibliographic Details
Main Authors: Xiangxiang Liu, Tianlei Jiao, Diganta Das, Ijaz Haider Naqvi, Michael Pecht
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
IGBT
time-series ANN
state-of-health
junction temperature
artificial intelligence
Online Access:https://ieeexplore.ieee.org/document/9463873/

Internet

https://ieeexplore.ieee.org/document/9463873/

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