Back Propagation Neural Network in Predicting the Thermal Fatigue Life of Microelectronic Chips
Main Authors: | , , |
---|---|
Format: | Article |
Language: | English |
Published: |
MIDEM Society - Society for Microelectronics, Electronic Components and Materials
2020-04-01
|
Series: | Informacije MIDEM |
Subjects: | |
Online Access: | http://www.midem-drustvo.si/Journal%20papers/MIDEM_50(2020)1p15.pdf |