Structural, morphology and electrical properties of layered copper selenide thin film

Structural, morphology and electrical properties of layered copper selenide thin film

Bibliographic Details
Main Authors: Ying Chyi Liew J., Talib Zainal, Mahmood W., Yunus M., Zainal Zulkarnain, Halim Shaari, Moksin Mohd, Yusoff Wan, Pah Lim K.
Format: Article
Language:English
Published: De Gruyter 2009-06-01
Series:Open Physics
Subjects:
cuse thin films
electrical conductivity
surface roughness
film thickness
grain size
71.20.nr
72.20.-i
73.21.ac
73.25.+i
73.50.-h
Online Access:https://doi.org/10.2478/s11534-009-0057-1
id doaj-c00f3c8cbb1a4db88754a6680cef859d
record_format Article
spelling doaj-c00f3c8cbb1a4db88754a6680cef859d2021-09-05T14:01:37ZengDe GruyterOpen Physics2391-54712009-06-017237938410.2478/s11534-009-0057-1Structural, morphology and electrical properties of layered copper selenide thin filmYing Chyi Liew J.0Talib Zainal1Mahmood W.2Yunus M.3Zainal Zulkarnain4Halim Shaari5Moksin Mohd6Yusoff Wan7Pah Lim K.8Faculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, MalaysiaFaculty of Science, Universiti Putra Malaysia, 43400 UPM, Serdang, Malaysiahttps://doi.org/10.2478/s11534-009-0057-1cuse thin filmselectrical conductivitysurface roughnessfilm thicknessgrain size71.20.nr72.20.-i73.21.ac73.25.+i73.50.-h
collection DOAJ
language English
format Article
sources DOAJ
author Ying Chyi Liew J.
Talib Zainal
Mahmood W.
Yunus M.
Zainal Zulkarnain
Halim Shaari
Moksin Mohd
Yusoff Wan
Pah Lim K.
spellingShingle Ying Chyi Liew J.
Talib Zainal
Mahmood W.
Yunus M.
Zainal Zulkarnain
Halim Shaari
Moksin Mohd
Yusoff Wan
Pah Lim K.
Structural, morphology and electrical properties of layered copper selenide thin film
Open Physics
cuse thin films
electrical conductivity
surface roughness
film thickness
grain size
71.20.nr
72.20.-i
73.21.ac
73.25.+i
73.50.-h
author_facet Ying Chyi Liew J.
Talib Zainal
Mahmood W.
Yunus M.
Zainal Zulkarnain
Halim Shaari
Moksin Mohd
Yusoff Wan
Pah Lim K.
author_sort Ying Chyi Liew J.
title Structural, morphology and electrical properties of layered copper selenide thin film
title_short Structural, morphology and electrical properties of layered copper selenide thin film
title_full Structural, morphology and electrical properties of layered copper selenide thin film
title_fullStr Structural, morphology and electrical properties of layered copper selenide thin film
title_full_unstemmed Structural, morphology and electrical properties of layered copper selenide thin film
title_sort structural, morphology and electrical properties of layered copper selenide thin film
publisher De Gruyter
series Open Physics
issn 2391-5471
publishDate 2009-06-01
topic cuse thin films
electrical conductivity
surface roughness
film thickness
grain size
71.20.nr
72.20.-i
73.21.ac
73.25.+i
73.50.-h
url https://doi.org/10.2478/s11534-009-0057-1
work_keys_str_mv AT yingchyiliewj structuralmorphologyandelectricalpropertiesoflayeredcopperselenidethinfilm
AT talibzainal structuralmorphologyandelectricalpropertiesoflayeredcopperselenidethinfilm
AT mahmoodw structuralmorphologyandelectricalpropertiesoflayeredcopperselenidethinfilm
AT yunusm structuralmorphologyandelectricalpropertiesoflayeredcopperselenidethinfilm
AT zainalzulkarnain structuralmorphologyandelectricalpropertiesoflayeredcopperselenidethinfilm
AT halimshaari structuralmorphologyandelectricalpropertiesoflayeredcopperselenidethinfilm
AT moksinmohd structuralmorphologyandelectricalpropertiesoflayeredcopperselenidethinfilm
AT yusoffwan structuralmorphologyandelectricalpropertiesoflayeredcopperselenidethinfilm
AT pahlimk structuralmorphologyandelectricalpropertiesoflayeredcopperselenidethinfilm
_version_ 1717809902299119616

Similar Items