Structural, morphology and electrical properties of layered copper selenide thin film

Bibliographic Details
Main Authors:	Ying Chyi Liew J., Talib Zainal, Mahmood W., Yunus M., Zainal Zulkarnain, Halim Shaari, Moksin Mohd, Yusoff Wan, Pah Lim K.
Format:	Article
Language:	English
Published:	De Gruyter 2009-06-01
Series:	Open Physics
Subjects:	cuse thin films electrical conductivity surface roughness film thickness grain size 71.20.nr 72.20.-i 73.21.ac 73.25.+i 73.50.-h
Online Access:	https://doi.org/10.2478/s11534-009-0057-1

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