The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon

A near-field microwave nondestructive diagnostics based on the total reflection phenomenon is described. The new type of schematic solution of device is proposed - a near-field interference microwave sensing system. The test diagnostics results in the conditions of metallized strips with breaks are...

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Main Authors: Belichenko V.P., Zapasnoy A.S., Mironchev A.S., Klokov A.V., Matvievskiy E.V.
Format: Article
Language:English
Published: EDP Sciences 2019-01-01
Series:ITM Web of Conferences
Online Access:https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_15025.pdf
id doaj-bf40eff862774832a4ad96eb948d879f
record_format Article
spelling doaj-bf40eff862774832a4ad96eb948d879f2021-04-02T11:55:41ZengEDP SciencesITM Web of Conferences2271-20972019-01-01301502510.1051/itmconf/20193015025itmconf_crimico2019_15025The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenonBelichenko V.P.Zapasnoy A.S.Mironchev A.S.Klokov A.V.Matvievskiy E.V.A near-field microwave nondestructive diagnostics based on the total reflection phenomenon is described. The new type of schematic solution of device is proposed - a near-field interference microwave sensing system. The test diagnostics results in the conditions of metallized strips with breaks are presented.https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_15025.pdf
collection DOAJ
language English
format Article
sources DOAJ
author Belichenko V.P.
Zapasnoy A.S.
Mironchev A.S.
Klokov A.V.
Matvievskiy E.V.
spellingShingle Belichenko V.P.
Zapasnoy A.S.
Mironchev A.S.
Klokov A.V.
Matvievskiy E.V.
The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon
ITM Web of Conferences
author_facet Belichenko V.P.
Zapasnoy A.S.
Mironchev A.S.
Klokov A.V.
Matvievskiy E.V.
author_sort Belichenko V.P.
title The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon
title_short The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon
title_full The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon
title_fullStr The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon
title_full_unstemmed The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon
title_sort perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon
publisher EDP Sciences
series ITM Web of Conferences
issn 2271-2097
publishDate 2019-01-01
description A near-field microwave nondestructive diagnostics based on the total reflection phenomenon is described. The new type of schematic solution of device is proposed - a near-field interference microwave sensing system. The test diagnostics results in the conditions of metallized strips with breaks are presented.
url https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_15025.pdf
work_keys_str_mv AT belichenkovp theperspectivesofnearfieldinterferencemicrowavesensingbasedonthefrustratedtotalreflectionphenomenon
AT zapasnoyas theperspectivesofnearfieldinterferencemicrowavesensingbasedonthefrustratedtotalreflectionphenomenon
AT mironchevas theperspectivesofnearfieldinterferencemicrowavesensingbasedonthefrustratedtotalreflectionphenomenon
AT klokovav theperspectivesofnearfieldinterferencemicrowavesensingbasedonthefrustratedtotalreflectionphenomenon
AT matvievskiyev theperspectivesofnearfieldinterferencemicrowavesensingbasedonthefrustratedtotalreflectionphenomenon
AT belichenkovp perspectivesofnearfieldinterferencemicrowavesensingbasedonthefrustratedtotalreflectionphenomenon
AT zapasnoyas perspectivesofnearfieldinterferencemicrowavesensingbasedonthefrustratedtotalreflectionphenomenon
AT mironchevas perspectivesofnearfieldinterferencemicrowavesensingbasedonthefrustratedtotalreflectionphenomenon
AT klokovav perspectivesofnearfieldinterferencemicrowavesensingbasedonthefrustratedtotalreflectionphenomenon
AT matvievskiyev perspectivesofnearfieldinterferencemicrowavesensingbasedonthefrustratedtotalreflectionphenomenon
_version_ 1721570823510163456