The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon
A near-field microwave nondestructive diagnostics based on the total reflection phenomenon is described. The new type of schematic solution of device is proposed - a near-field interference microwave sensing system. The test diagnostics results in the conditions of metallized strips with breaks are...
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EDP Sciences
2019-01-01
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doaj-bf40eff862774832a4ad96eb948d879f2021-04-02T11:55:41ZengEDP SciencesITM Web of Conferences2271-20972019-01-01301502510.1051/itmconf/20193015025itmconf_crimico2019_15025The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenonBelichenko V.P.Zapasnoy A.S.Mironchev A.S.Klokov A.V.Matvievskiy E.V.A near-field microwave nondestructive diagnostics based on the total reflection phenomenon is described. The new type of schematic solution of device is proposed - a near-field interference microwave sensing system. The test diagnostics results in the conditions of metallized strips with breaks are presented.https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_15025.pdf |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Belichenko V.P. Zapasnoy A.S. Mironchev A.S. Klokov A.V. Matvievskiy E.V. |
spellingShingle |
Belichenko V.P. Zapasnoy A.S. Mironchev A.S. Klokov A.V. Matvievskiy E.V. The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon ITM Web of Conferences |
author_facet |
Belichenko V.P. Zapasnoy A.S. Mironchev A.S. Klokov A.V. Matvievskiy E.V. |
author_sort |
Belichenko V.P. |
title |
The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon |
title_short |
The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon |
title_full |
The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon |
title_fullStr |
The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon |
title_full_unstemmed |
The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon |
title_sort |
perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon |
publisher |
EDP Sciences |
series |
ITM Web of Conferences |
issn |
2271-2097 |
publishDate |
2019-01-01 |
description |
A near-field microwave nondestructive diagnostics based on the total reflection phenomenon is described. The new type of schematic solution of device is proposed - a near-field interference microwave sensing system. The test diagnostics results in the conditions of metallized strips with breaks are presented. |
url |
https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_15025.pdf |
work_keys_str_mv |
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