The perspectives of near-field interference microwave sensing based on the frustrated total reflection phenomenon
A near-field microwave nondestructive diagnostics based on the total reflection phenomenon is described. The new type of schematic solution of device is proposed - a near-field interference microwave sensing system. The test diagnostics results in the conditions of metallized strips with breaks are...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2019-01-01
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| Series: | ITM Web of Conferences |
| Online Access: | https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_15025.pdf |