Sweet Corn Yield Simulation Using Normalized Difference Vegetation Index and Leaf Area Index

Sweet Corn Yield Simulation Using Normalized Difference Vegetation Index and Leaf Area Index

We determined the accuracy and reliability of yielding models by using the values of two differently obtained indexes – the leaf area index (LAI) obtained through direct surface measurements, and the normalized difference vegetation index (NDVI) obtained through spatial remote sensing of crops. The...

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Bibliographic Details
Main Author: Pavlo Volodymyrovych Lykhovyd
Format: Article
Language:English
Published: Polish Society of Ecological Engineering (PTIE) 2020-04-01
Series:Journal of Ecological Engineering
Subjects:
direct measurements
mathematical model
regression analysis
remote sensing
sweet corn
yield prediction
Online Access:http://www.journalssystem.com/jeeng/Sweet-Corn-Yield-Simulation-Using-Normalized-Difference-Vegetation-Index-and-Leaf,118274,0,2.html

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