Sweet Corn Yield Simulation Using Normalized Difference Vegetation Index and Leaf Area Index
We determined the accuracy and reliability of yielding models by using the values of two differently obtained indexes – the leaf area index (LAI) obtained through direct surface measurements, and the normalized difference vegetation index (NDVI) obtained through spatial remote sensing of crops. The...
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| Format: | Article |
| Language: | English |
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Polish Society of Ecological Engineering (PTIE)
2020-04-01
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| Series: | Journal of Ecological Engineering |
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| Online Access: | http://www.journalssystem.com/jeeng/Sweet-Corn-Yield-Simulation-Using-Normalized-Difference-Vegetation-Index-and-Leaf,118274,0,2.html |