Quantum advantage in postselected metrology

In quantum metrology (as well as computing) it is not easy to pinpoint the specific source of quantum advantage. Here, the authors reveal a link between postselection and the unusually high rates of information per final measurement in general quantum parameter-estimation scenarios.

Bibliographic Details
Main Authors: David R. M. Arvidsson-Shukur, Nicole Yunger Halpern, Hugo V. Lepage, Aleksander A. Lasek, Crispin H. W. Barnes, Seth Lloyd
Format: Article
Language:English
Published: Nature Publishing Group 2020-07-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-020-17559-w
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spelling doaj-ba5f29d271834adeb475aeace53c602b2021-08-01T11:40:20ZengNature Publishing GroupNature Communications2041-17232020-07-011111710.1038/s41467-020-17559-wQuantum advantage in postselected metrologyDavid R. M. Arvidsson-Shukur0Nicole Yunger Halpern1Hugo V. Lepage2Aleksander A. Lasek3Crispin H. W. Barnes4Seth Lloyd5Cavendish Laboratory, Department of Physics, University of CambridgeResearch Laboratory of Electronics, Massachusetts Institute of TechnologyCavendish Laboratory, Department of Physics, University of CambridgeCavendish Laboratory, Department of Physics, University of CambridgeCavendish Laboratory, Department of Physics, University of CambridgeDepartment of Mechanical Engineering, Massachusetts Institute of TechnologyIn quantum metrology (as well as computing) it is not easy to pinpoint the specific source of quantum advantage. Here, the authors reveal a link between postselection and the unusually high rates of information per final measurement in general quantum parameter-estimation scenarios.https://doi.org/10.1038/s41467-020-17559-w
collection DOAJ
language English
format Article
sources DOAJ
author David R. M. Arvidsson-Shukur
Nicole Yunger Halpern
Hugo V. Lepage
Aleksander A. Lasek
Crispin H. W. Barnes
Seth Lloyd
spellingShingle David R. M. Arvidsson-Shukur
Nicole Yunger Halpern
Hugo V. Lepage
Aleksander A. Lasek
Crispin H. W. Barnes
Seth Lloyd
Quantum advantage in postselected metrology
Nature Communications
author_facet David R. M. Arvidsson-Shukur
Nicole Yunger Halpern
Hugo V. Lepage
Aleksander A. Lasek
Crispin H. W. Barnes
Seth Lloyd
author_sort David R. M. Arvidsson-Shukur
title Quantum advantage in postselected metrology
title_short Quantum advantage in postselected metrology
title_full Quantum advantage in postselected metrology
title_fullStr Quantum advantage in postselected metrology
title_full_unstemmed Quantum advantage in postselected metrology
title_sort quantum advantage in postselected metrology
publisher Nature Publishing Group
series Nature Communications
issn 2041-1723
publishDate 2020-07-01
description In quantum metrology (as well as computing) it is not easy to pinpoint the specific source of quantum advantage. Here, the authors reveal a link between postselection and the unusually high rates of information per final measurement in general quantum parameter-estimation scenarios.
url https://doi.org/10.1038/s41467-020-17559-w
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