Quantum advantage in postselected metrology

In quantum metrology (as well as computing) it is not easy to pinpoint the specific source of quantum advantage. Here, the authors reveal a link between postselection and the unusually high rates of information per final measurement in general quantum parameter-estimation scenarios.

Bibliographic Details
Main Authors: David R. M. Arvidsson-Shukur, Nicole Yunger Halpern, Hugo V. Lepage, Aleksander A. Lasek, Crispin H. W. Barnes, Seth Lloyd
Format: Article
Language:English
Published: Nature Publishing Group 2020-07-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-020-17559-w