Comparison of CMOS and PSP intraoral digital sensors in the diagnosis of secondary caries adjacent to amalgam restorations
Background and Aim: Considering the consequences of false positive (FP) and false negative (FN) diagnoses as well as the lack of information on the diagnostic ability of photostimulable phosphor plate (PSP) and complementary metal oxide semiconductor (CMOS) sensors in the detection of secondary cari...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Islamic Azad University
2017-10-01
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| Series: | Journal of Research in Dental and Maxillofacial Sciences |
| Subjects: | |
| Online Access: | http://jrdms.dentaliau.ac.ir/browse.php?a_code=A-10-592-1&slc_lang=en&sid=1 |