Reconstructing leaf growth based on non-destructive digitizing and low-parametric shape evolution for plant modelling over a growth cycle
A simple and efficient photometric methodology is presented, covering all steps from field data acquisition to binarization and allowing for leaf contour modelling. This method comprises the modelling of area and size (correlated and modelled with a Chapman-Richards growth function, using...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Finnish Society of Forest Science
2014-01-01
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| Series: | Silva Fennica |
| Online Access: | https://www.silvafennica.fi/article/1019 |