Nanoscale characterization of electrical transport at metal/3C-SiC interfaces

Nanoscale characterization of electrical transport at metal/3C-SiC interfaces

<p>Abstract</p> <p>In this work, the transport properties of metal/3C-SiC interfaces were monitored employing a nanoscale characterization approach in combination with conventional electrical measurements. In particular, using conductive atomic force microscopy allowed demonstratin...

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Bibliographic Details
Main Authors: Leone Stefano, Reshanov Sergey, Eriksson Jens, Roccaforte Fabrizio, Giannazzo Filippo, LoNigro Raffaella, Fiorenza Patrick, Raineri Vito
Format: Article
Language:English
Published: SpringerOpen 2011-01-01
Series:Nanoscale Research Letters
Online Access:http://www.nanoscalereslett.com/content/6/1/120

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http://www.nanoscalereslett.com/content/6/1/120

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