The TanDEM-X Digital Elevation Model and Terrestrial Impact Structures

The TanDEM-X Digital Elevation Model and Terrestrial Impact Structures

We utilized the TanDEM-X digital elevation model (DEM) for investigating the complete record of confirmed terrestrial impact structures with respect to its suitability to support geological analysis. The consistently high resolution and high accuracy of this model is a prerequisite for detailed morp...

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Bibliographic Details
Main Authors: Manfred Gottwald, Thomas Kenkmann, Wolf Reimold, Thomas Fritz, Helko Breit
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
Subjects:
Digital elevation model (DEM)
impact geology
impact structures
radar interferometry
TanDEM-X
terrain mapping
Online Access:https://ieeexplore.ieee.org/document/9390180/

Internet

https://ieeexplore.ieee.org/document/9390180/

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