InGaAs/AlAs Resonant Tunneling Diodes for THz Applications: An Experimental Investigation

This paper presents an experimental study of InGaAs/AlAs resonant tunneling diodes designed to improve the diode characteristics using five different device structures. A promising high peak to valley current ratio of 5.2 was obtained for a very low current density device. As expected, the measured...

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Bibliographic Details
Main Authors: Saad G. Muttlak, Omar S. Abdulwahid, J. Sexton, Michael J. Kelly, Mohamed Missous
Format: Article
Language:English
Published: IEEE 2018-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8279410/