Field Effect on Crystal Phase of Silicon in Si/CeO2/SiO2 Structure
The structural, optical, and conductivity properties of silicon film deposited on cerium dioxide buffer layer were studied. The electronic structure of system consists of various defect levels inside band gap. The temperature spatial distribution plays a great role in silicon crystallization. The fi...
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Series: | Journal of Nanomaterials |
Online Access: | http://dx.doi.org/10.1155/2008/712985 |
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doaj-b67e63b80237487a8184609e2a9e93ff2020-11-24T22:32:26ZengHindawi LimitedJournal of Nanomaterials1687-41101687-41292008-01-01200810.1155/2008/712985712985Field Effect on Crystal Phase of Silicon in Si/CeO2/SiO2 StructureDmitry E. Milovzorov0Fluens Technology Group, Scientific Institute of Physical and Chemical Researches Moscow, Vorontsovo pole 10, Shelkovskoe Shosse 871225, 107497 Moscow, RussiaThe structural, optical, and conductivity properties of silicon film deposited on cerium dioxide buffer layer were studied. The electronic structure of system consists of various defect levels inside band gap. The temperature spatial distribution plays a great role in silicon crystallization. The field destruction of crystal phase and its restoration, after annealing, were investigated.http://dx.doi.org/10.1155/2008/712985 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Dmitry E. Milovzorov |
spellingShingle |
Dmitry E. Milovzorov Field Effect on Crystal Phase of Silicon in Si/CeO2/SiO2 Structure Journal of Nanomaterials |
author_facet |
Dmitry E. Milovzorov |
author_sort |
Dmitry E. Milovzorov |
title |
Field Effect on Crystal Phase of Silicon in Si/CeO2/SiO2 Structure |
title_short |
Field Effect on Crystal Phase of Silicon in Si/CeO2/SiO2 Structure |
title_full |
Field Effect on Crystal Phase of Silicon in Si/CeO2/SiO2 Structure |
title_fullStr |
Field Effect on Crystal Phase of Silicon in Si/CeO2/SiO2 Structure |
title_full_unstemmed |
Field Effect on Crystal Phase of Silicon in Si/CeO2/SiO2 Structure |
title_sort |
field effect on crystal phase of silicon in si/ceo2/sio2 structure |
publisher |
Hindawi Limited |
series |
Journal of Nanomaterials |
issn |
1687-4110 1687-4129 |
publishDate |
2008-01-01 |
description |
The structural, optical, and conductivity properties of silicon film deposited on cerium dioxide buffer layer were studied. The electronic structure of system consists of various defect levels inside band gap. The temperature spatial distribution plays a great role in silicon crystallization. The field destruction of crystal phase and its restoration, after annealing, were investigated. |
url |
http://dx.doi.org/10.1155/2008/712985 |
work_keys_str_mv |
AT dmitryemilovzorov fieldeffectoncrystalphaseofsiliconinsiceo2sio2structure |
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1725733978221051904 |