Field Effect on Crystal Phase of Silicon in Si/CeO2/SiO2 Structure
The structural, optical, and conductivity properties of silicon film deposited on cerium dioxide buffer layer were studied. The electronic structure of system consists of various defect levels inside band gap. The temperature spatial distribution plays a great role in silicon crystallization. The fi...
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| Format: | Article |
| Language: | English |
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Hindawi Limited
2008-01-01
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| Series: | Journal of Nanomaterials |
| Online Access: | http://dx.doi.org/10.1155/2008/712985 |