Line scale measurement using image registration
Currently, most advances in dimensional metrology might be seen by the evolution of non-contact measurement (optical measurements), in order to provide traceability for different areas that needs to calibrate microscopes or optical measure machines. In a similar way, the use of image processing tech...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2013-01-01
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| Series: | International Journal of Metrology and Quality Engineering |
| Subjects: | |
| Online Access: | https://www.metrology-journal.org/articles/ijmqe/pdf/2013/02/ijmqe130047.pdf |