Determination of microrelief of the sample by singular beams superposition
In present paper we propose easy way to implement method of interfering vortices with opposite topological charge for the real time determination of the thickness and information about the surface of studied samples with the resolution up to 7 nanometers. The determination of the characteristics of...
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Samara National Research University
2019-10-01
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| Series: | Компьютерная оптика |
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| Online Access: | http://computeroptics.ru/KO/PDF/KO43-5/430505.pdf |
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doaj-b1eb13e62ceb4f4cb0359131f98c88952020-11-25T01:08:56ZengSamara National Research UniversityКомпьютерная оптика0134-24522412-61792019-10-0143574174610.18287/2412-6179-2019-43-5-741-746Determination of microrelief of the sample by singular beams superpositionBogdan V. Sokolenko0Natalia V. Shostka1Olga S. Karakchieva2Alexander V. Volyar 3Dmitrii A. Poletaev4V.I. Vernadsky Crimean Federal University, Institute of Physics and Technology, 295007, Vernadsky av., Simferopol, RussiaV.I. Vernadsky Crimean Federal University, Scientific Research departmentV.I. Vernadsky Crimean Federal University, Scientific Research departmentV.I. Vernadsky Crimean Federal University, Institute of Physics and Technology, 295007, Vernadsky av., Simferopol, RussiaV.I. Vernadsky Crimean Federal University, Institute of Physics and Technology, 295007, Vernadsky av., Simferopol, RussiaIn present paper we propose easy way to implement method of interfering vortices with opposite topological charge for the real time determination of the thickness and information about the surface of studied samples with the resolution up to 7 nanometers. The determination of the characteristics of the medial cross-section of submicron-objects becomes possible due to phase sensitivity of interfering singular beams to the slightest changes in the optical path difference between them. The dependence of rotational angle of resulting interference pattern in case of different sample thickness for two singular beams superposition is considered in detail.http://computeroptics.ru/KO/PDF/KO43-5/430505.pdfoptical vortexphaseoptical microscopysingular beamssurface relief detection |
| collection |
DOAJ |
| language |
English |
| format |
Article |
| sources |
DOAJ |
| author |
Bogdan V. Sokolenko Natalia V. Shostka Olga S. Karakchieva Alexander V. Volyar Dmitrii A. Poletaev |
| spellingShingle |
Bogdan V. Sokolenko Natalia V. Shostka Olga S. Karakchieva Alexander V. Volyar Dmitrii A. Poletaev Determination of microrelief of the sample by singular beams superposition Компьютерная оптика optical vortex phase optical microscopy singular beams surface relief detection |
| author_facet |
Bogdan V. Sokolenko Natalia V. Shostka Olga S. Karakchieva Alexander V. Volyar Dmitrii A. Poletaev |
| author_sort |
Bogdan V. Sokolenko |
| title |
Determination of microrelief of the sample by singular beams superposition |
| title_short |
Determination of microrelief of the sample by singular beams superposition |
| title_full |
Determination of microrelief of the sample by singular beams superposition |
| title_fullStr |
Determination of microrelief of the sample by singular beams superposition |
| title_full_unstemmed |
Determination of microrelief of the sample by singular beams superposition |
| title_sort |
determination of microrelief of the sample by singular beams superposition |
| publisher |
Samara National Research University |
| series |
Компьютерная оптика |
| issn |
0134-2452 2412-6179 |
| publishDate |
2019-10-01 |
| description |
In present paper we propose easy way to implement method of interfering vortices with opposite topological charge for the real time determination of the thickness and information about the surface of studied samples with the resolution up to 7 nanometers. The determination of the characteristics of the medial cross-section of submicron-objects becomes possible due to phase sensitivity of interfering singular beams to the slightest changes in the optical path difference between them. The dependence of rotational angle of resulting interference pattern in case of different sample thickness for two singular beams superposition is considered in detail. |
| topic |
optical vortex phase optical microscopy singular beams surface relief detection |
| url |
http://computeroptics.ru/KO/PDF/KO43-5/430505.pdf |
| work_keys_str_mv |
AT bogdanvsokolenko determinationofmicroreliefofthesamplebysingularbeamssuperposition AT nataliavshostka determinationofmicroreliefofthesamplebysingularbeamssuperposition AT olgaskarakchieva determinationofmicroreliefofthesamplebysingularbeamssuperposition AT alexandervvolyar determinationofmicroreliefofthesamplebysingularbeamssuperposition AT dmitriiapoletaev determinationofmicroreliefofthesamplebysingularbeamssuperposition |
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1725180915329531904 |