Characterization of the materials and techniques of a birthday inscribed lacquer plaque of the qing dynasty

Characterization of the materials and techniques of a birthday inscribed lacquer plaque of the qing dynasty

Abstract In this study, in order to analyze the materials and techniques used for the production of the inscribed plaques, multi-analytical scientific approach, including optical microscopy (OM), scanning electron microscopy with energy dispersive X-ray spectroscopy (SEM–EDS), X-ray diffraction (XRD...

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Bibliographic Details
Main Authors: Liping Zheng, Liqin Wang, Xing Zhao, Jiali Yang, Mengxia Zhang, Yunfu Wang
Format: Article
Language:English
Published: SpringerOpen 2020-11-01
Series:Heritage Science
Subjects:
Inscribed plaque
μ-FTIR
μ-Raman
XRD
SEM–EDS
Materials
Online Access:http://link.springer.com/article/10.1186/s40494-020-00462-4

Internet

http://link.springer.com/article/10.1186/s40494-020-00462-4

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