IETCR: An Information Entropy Based Test Case Reduction Strategy for Mutation-Based Fault Localization
Mutation-based fault localization (MBFL) is a recently proposed technique with the advantage of high fault localization accuracy. However, such a mutation analysis based technique is difficult to be accepted by industry due to its huge computational cost on mutation analysis. There are three ways to...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9122504/ |