Fault-Tolerant Architecture for Reliable Integrated Gate Drivers
This paper proposes fault-tolerant (FT) architecture for integrated gate drivers. It can automatically detect faults in the gate driver caused by external physical stress and then immediately repair them as well. As a result, it can contribute to highly reliable display products. The proposed archit...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
|
| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8847409/ |