A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images

Image noise is an important factor that inﬂuences the accuracy of strain ﬁeld measurements by means of digital image correlation and scanning electron microscope (SEM) imaging. We propose a new model to quantify the SEM image noise, which extends the classical photon noise model by taking into ac...

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Main Authors:	Bornert M., Caldemaison D., Heripre E., El Outmani S., Wang L.L.
Format:	Article
Language:	English
Published:	EDP Sciences 2010-06-01
Series:	EPJ Web of Conferences
Online Access:	http://dx.doi.org/10.1051/epjconf/20100640008

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spelling	doaj-ae70ed1990e14299ba7ba461e2e4f76e2021-08-02T17:34:21ZengEDP SciencesEPJ Web of Conferences2100-014X2010-06-0164000810.1051/epjconf/20100640008A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM imagesBornert M.Caldemaison D.Heripre E.El Outmani S.Wang L.L.Image noise is an important factor that inﬂuences the accuracy of strain ﬁeld measurements by means of digital image correlation and scanning electron microscope (SEM) imaging. We propose a new model to quantify the SEM image noise, which extends the classical photon noise model by taking into account the brightness setup in SEM imaging. Furthermore, we apply this model to investigate the impact of diﬀerent SEM setting parameters on image noise, such as detector, dwell time, spot size, and pressure in the SEM chamber in the context of low vacuum imaging. http://dx.doi.org/10.1051/epjconf/20100640008
collection	DOAJ
language	English
format	Article
sources	DOAJ
author	Bornert M. Caldemaison D. Heripre E. El Outmani S. Wang L.L.
spellingShingle	Bornert M. Caldemaison D. Heripre E. El Outmani S. Wang L.L. A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images EPJ Web of Conferences
author_facet	Bornert M. Caldemaison D. Heripre E. El Outmani S. Wang L.L.
author_sort	Bornert M.
title	A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images
title_short	A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images
title_full	A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images
title_fullStr	A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images
title_full_unstemmed	A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images
title_sort	simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using dic and sem images
publisher	EDP Sciences
series	EPJ Web of Conferences
issn	2100-014X
publishDate	2010-06-01
description	Image noise is an important factor that inﬂuences the accuracy of strain ﬁeld measurements by means of digital image correlation and scanning electron microscope (SEM) imaging. We propose a new model to quantify the SEM image noise, which extends the classical photon noise model by taking into account the brightness setup in SEM imaging. Furthermore, we apply this model to investigate the impact of diﬀerent SEM setting parameters on image noise, such as detector, dwell time, spot size, and pressure in the SEM chamber in the context of low vacuum imaging.
url	http://dx.doi.org/10.1051/epjconf/20100640008
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A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images

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