A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images
Image noise is an important factor that influences the accuracy of strain field measurements by means of digital image correlation and scanning electron microscope (SEM) imaging. We propose a new model to quantify the SEM image noise, which extends the classical photon noise model by taking into ac...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2010-06-01
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| Series: | EPJ Web of Conferences |
| Online Access: | http://dx.doi.org/10.1051/epjconf/20100640008 |