Incipient Fault Diagnosis Method for IGBT Drive Circuit Based on Improved SAE

Incipient Fault Diagnosis Method for IGBT Drive Circuit Based on Improved SAE

An incipient fault diagnosis method devised for insulated gate bipolar transistor (IGBT) drive circuit based on improved stack auto-encoder (SAE) is recommended. First, the Monte Carlo method is applied to extracting the time domain response signal of the circuit under test as sample data. Then, wit...

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Bibliographic Details
Main Authors: Yigang He, Chenchen Li, Tao Wang, Tiancheng Shi, Lin Tao, Weibo Yuan
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
IGBT drive circuit
incipient diagnosis
deep learning
stacked auto-encoder
multi-classification relevant vector machine
Online Access:https://ieeexplore.ieee.org/document/8736733/

Internet

https://ieeexplore.ieee.org/document/8736733/

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