QTL mapping of adult plant resistance to stripe rust and leaf rust in a Fuyu 3/Zhengzhou 5389 wheat population
Stripe or yellow rust (YR) and leaf rust (LR) cause large losses in wheat production worldwide. Resistant cultivars curtail the levels of losses. The present study aimed to identify quantitative trait loci (QTL) for YR and LR resistance in 147 F2:6 recombinant inbred lines (RIL) derived from the cro...
Main Authors: | , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
KeAi Communications Co., Ltd.
2020-08-01
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Series: | Crop Journal |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2214514120300015 |