QTL mapping of adult plant resistance to stripe rust and leaf rust in a Fuyu 3/Zhengzhou 5389 wheat population

Stripe or yellow rust (YR) and leaf rust (LR) cause large losses in wheat production worldwide. Resistant cultivars curtail the levels of losses. The present study aimed to identify quantitative trait loci (QTL) for YR and LR resistance in 147 F2:6 recombinant inbred lines (RIL) derived from the cro...

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Bibliographic Details
Main Authors: Takele Weldu Gebrewahid, Peipei Zhang, Yue Zhou, Xiaocui Yan, Xianchun Xia, Zhonghu He, Daqun Liu, Zaifeng Li
Format: Article
Language:English
Published: KeAi Communications Co., Ltd. 2020-08-01
Series:Crop Journal
Subjects:
SNP
Online Access:http://www.sciencedirect.com/science/article/pii/S2214514120300015