Epitaxy: Criterion for orientation

<p>This review is motivated by the impact of epitaxy – the oriented overgrowth of a thin crystalline layer (the epilayer) on a crystalline substrate – in pursuit of perfection in crystallinity as needed in high grade technology and fundamental studies. While acceptable knowledge with respect t...

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Bibliographic Details
Main Author: J. H. van der Merwe
Format: Article
Language:Afrikaans
Published: South African Journal of Science and Technology 2001-09-01
Series:South African Journal of Science and Technology