Mapping Reliability Predictors of Low-Voltage Metal Oxide Surge Arresters Using Contour Plots
Reliability assessment of MOSA devices requires accurate estimation of life distribution parameters or reliability predictors. Estimated reliability predictors consist of reasonable indicators of failure probability and mean life trends as a result of applied stress over a given period of time. Rece...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9187677/ |