Mapping Reliability Predictors of Low-Voltage Metal Oxide Surge Arresters Using Contour Plots

Mapping Reliability Predictors of Low-Voltage Metal Oxide Surge Arresters Using Contour Plots

Reliability assessment of MOSA devices requires accurate estimation of life distribution parameters or reliability predictors. Estimated reliability predictors consist of reasonable indicators of failure probability and mean life trends as a result of applied stress over a given period of time. Rece...

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Bibliographic Details
Main Authors: Pitshou Bokoro, Wesley Doorsamy
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Metal oxide surge arresters
contour plots
accelerated life tests
reliability predictors
Weibull distribution
probability density function
Online Access:https://ieeexplore.ieee.org/document/9187677/

Internet

https://ieeexplore.ieee.org/document/9187677/

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