In Situ Creep Behavior Characterization of Single Crystal Superalloy by UV-DIC at 980 °C
High temperature creep resistance is a critical characteristic of Ni-based single crystal (SX) superalloys. In this work, the creep behavior of a Ni-based SX superalloy was in situ characterized at 980 °C by ultraviolet (UV) imaging combined two-dimensional digital image correlation (DIC) i...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2019-09-01
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| Series: | Coatings |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-6412/9/10/598 |