Shock-induced breaking of the nanowire with the dependence of crystallographic orientation and strain rate

<p>Abstract</p> <p>The failure of the metallic nanowire has raised concerns due to its applied reliability in nanoelectromechanical system. In this article, the breaking failure is studied for the [100], [110], and [111] single-crystal copper nanowires at different strain rates. Th...

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Bibliographic Details
Main Authors: Wang Fenying, Gao Yajun, Zhu Tiemin, Zhao Jianwei
Format: Article
Language:English
Published: SpringerOpen 2011-01-01
Series:Nanoscale Research Letters
Online Access:http://www.nanoscalereslett.com/content/6/1/291