Multi-slice ptychography enables high-resolution measurements in extended chemical reactors
Abstract Ptychographic X-ray microscopy is an ideal tool to observe chemical processes under in situ conditions. Chemical reactors, however, are often thicker than the depth of field, limiting the lateral spatial resolution in projection images. To overcome this limit and reach higher lateral spatia...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2021-01-01
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| Series: | Scientific Reports |
| Online Access: | https://doi.org/10.1038/s41598-020-80926-6 |