Effects of Perpendicular Magnetic Field Annealing on the Structural and Magnetic Properties of [Co/Ni]<sub>2</sub>/PtMn Thin Films

In this study, [Co/Ni]<sub>2</sub>/PtMn thin films with different PtMn thicknesses (2.7 to 32.4 nm) were prepared on Si/SiO<sub>2</sub> substrates. The post-deposition perpendicular magnetic field annealing (MFA) processes were carried out to modify the structures and magneti...

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Bibliographic Details
Main Authors: Roshni Yadav, Chun Hsien Wu, I Fen Huang, Xu Li, Te Hu Wu, Ko Wei Lin
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Magnetochemistry
Subjects:
Online Access:https://www.mdpi.com/2312-7481/7/3/38