A Deep Multi-Label Learning Framework for the Intelligent Fault Diagnosis of Machines

A Deep Multi-Label Learning Framework for the Intelligent Fault Diagnosis of Machines

Deep learning has been applied in intelligent fault diagnosis of machines since it trains deep neural networks to simultaneously learn features and recognize faults. In the intelligent fault diagnosis methods based on deep learning, feature learning and fault recognition are achieved by solving a mu...

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Bibliographic Details
Main Authors: Jianjun Shen, Shihao Li, Feng Jia, Hao Zuo, Junxing Ma
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Deep learning
intelligent fault diagnosis
multi-label classification
missing label problem
bearing
compound fault
Online Access:https://ieeexplore.ieee.org/document/9118881/

Internet

https://ieeexplore.ieee.org/document/9118881/

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