Defect Enhancement Generative Adversarial Network for Enlarging Data Set of Microcrack Defect

Defect Enhancement Generative Adversarial Network for Enlarging Data Set of Microcrack Defect

This paper presents a micro defect data set expansion method focuses on the microcrack defect of magnetic ring. Deep neural networks require a mass of training samples to be fully optimized. However, it is difficult to obtain a mass of defective samples in industrial field. In the case of insufficie...

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Bibliographic Details
Main Authors: Song Lin, Zhiyong He, Lining Sun
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Convolutional neural network (CNN)
generative adversarial networks(GANs)
intelligent manufacturing
defect detection
deeplearning
Online Access:https://ieeexplore.ieee.org/document/8861335/

Internet

https://ieeexplore.ieee.org/document/8861335/

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