Characterization of low loss microstrip resonators as a building block for circuit QED in a 3D waveguide
Here we present the microwave characterization of microstrip resonators, made from aluminum and niobium, inside a 3D microwave waveguide. In the low temperature, low power limit internal quality factors of up to one million were reached. We found a good agreement to models predicting conductive loss...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2017-08-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4992070 |