Abundance of molecular triple ionization by double Auger decay

Abundance of molecular triple ionization by double Auger decay

Abstract Systematic measurements of electron emission following formation of single 1s or 2p core holes in molecules with C, O, F, Si, S and Cl atoms show that overall triple ionization can make up as much as 20% of the decay. The proportion of triple ionization is observed to follow a linear trend...

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Bibliographic Details
Main Authors: A. Hult Roos, J. H. D. Eland, J. Andersson, R. J. Squibb, D. Koulentianos, O. Talaee, R. Feifel
Format: Article
Language:English
Published: Nature Publishing Group 2018-11-01
Series:Scientific Reports
Subjects:
DA Decay
Triple Ionization
Auger Decay
Double Auger (DA)
Core Hole Formation
Online Access:https://doi.org/10.1038/s41598-018-34807-8

Internet

https://doi.org/10.1038/s41598-018-34807-8

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