Scattering-type scanning near-field optical microscopy with low-repetition-rate pulsed light source through phase-domain sampling

Low repetition rate lasers are suitable for studying nonlinear optical phenomena, while near-field microscopy allows high spatial resolution for nanomaterial characterisation. Here, Wang et al. enable scattering-type near-field microscopy with low repetition rate lasers through phase-domain sampling...

Full description

Bibliographic Details
Main Authors: Haomin Wang, Le Wang, Xiaoji G. Xu
Format: Article
Language:English
Published: Nature Publishing Group 2016-10-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/ncomms13212