Precise Brightfield Localization Alignment for Fourier Ptychographic Microscopy

Precise Brightfield Localization Alignment for Fourier Ptychographic Microscopy

Fourier ptychographic microscopy (FPM) is a recently developed microscope technology that overcomes the resolution limit of a low numerical aperture objective lens by employing angular varying illuminations. Combining the concepts of ptychography, synthetic aperture, and phase retrieval, FPM achieve...

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Bibliographic Details
Main Authors: Jizhou Zhang, Tingfa Xu, Jingdan Liu, Sining Chen, Xing Wang
Format: Article
Language:English
Published: IEEE 2018-01-01
Series:IEEE Photonics Journal
Subjects:
Coherence imaging
microscopy
imaging system.
Online Access:https://ieeexplore.ieee.org/document/8166728/

Internet

https://ieeexplore.ieee.org/document/8166728/

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