Influence of diffusion on space-charge-limited current measurements in organic semiconductors
Numerical simulations of current–voltage curves in electron-only devices are used to discuss the influence of charged defects on the information derived from fitting space-charge-limited current models to the data. Charged, acceptor-like defects lead to barriers impeding the flow of electrons in ele...
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2013-03-01
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| Series: | Beilstein Journal of Nanotechnology |
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| Online Access: | https://doi.org/10.3762/bjnano.4.18 |