Ranking Loss: Maximizing the Success Rate in Deep Learning Side-Channel Analysis

Ranking Loss: Maximizing the Success Rate in Deep Learning Side-Channel Analysis

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The side-channel community recently investigated a new approach, based on deep learning, to significantly improve profiled attacks against embedded systems. Compared to template attacks, deep learning techniques can deal with protected implementations, such as masking or desynchronization, without...

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Bibliographic Details
Main Authors: Gabriel Zaid, Lilian Bossuet, François Dassance, Amaury Habrard, Alexandre Venelli
Format: Article
Language:English
Published: Ruhr-Universität Bochum 2020-12-01
Series:Transactions on Cryptographic Hardware and Embedded Systems
Subjects:
Side-Channel Attacks
Deep Learning
Learning to Rank
Loss function
Success Rate
Mutual Information
Online Access:https://ojs-dev.ub.rub.de/index.php/TCHES/article/view/8726

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https://ojs-dev.ub.rub.de/index.php/TCHES/article/view/8726

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