Fault and Error Tolerance in Neural Networks: A Review
Beyond energy, the growing number of defects in physical substrates is becoming another major constraint that affects the design of computing devices and systems. As the underlying semiconductor technologies are getting less and less reliable, the probability that some components of computing device...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2017-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8013784/ |