TCAD-Machine Learning Framework for Device Variation and Operating Temperature Analysis With Experimental Demonstration

TCAD-Machine Learning Framework for Device Variation and Operating Temperature Analysis With Experimental Demonstration

This work, for the first time, experimentally demonstrates a TCAD-Machine Learning (TCAD-ML) framework to assist the analysis of device-to-device variation and operating (ambient) temperature without the need of physical quantities extraction. The ML algorithm used in this work is the Principal Comp...

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Bibliographic Details
Main Authors: Hiu Yung Wong, Ming Xiao, Boyan Wang, Yan Ka Chiu, Xiaodong Yan, Jiahui Ma, Kohei Sasaki, Han Wang, Yuhao Zhang
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
TCAD simulation
machine learning
variation
principal component analysis
ultra-wide bandgap
gallium oxide
Online Access:https://ieeexplore.ieee.org/document/9199850/

Internet

https://ieeexplore.ieee.org/document/9199850/

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