Mapping three-dimensional near-field responses with reconstruction scattering-type scanning near-field optical microscopy
Scattering-type scanning near-field optical microscopy (s-SNOM) enables mapping of nanoscale field distributions in two dimensions. However, the standard s-SNOM technique lacks direct resolving ability along the vertical direction, therefore unable to provide full three-dimensional near-field respon...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2017-05-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4984924 |