Identifying the Optimal Subsets of Test Items through Adaptive Test for Cost Reduction of ICs
With the growing complexity of integrated circuits (ICs), more and more test items are required in testing. However, the large number of invalid items (which narrowly pass the test) continues to increase the test time and, consequently, test costs. Aiming to address the problems of long test time an...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-03-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/10/6/680 |