Identifying the Optimal Subsets of Test Items through Adaptive Test for Cost Reduction of ICs

Identifying the Optimal Subsets of Test Items through Adaptive Test for Cost Reduction of ICs

With the growing complexity of integrated circuits (ICs), more and more test items are required in testing. However, the large number of invalid items (which narrowly pass the test) continues to increase the test time and, consequently, test costs. Aiming to address the problems of long test time an...

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Bibliographic Details
Main Authors: Huaguo Liang, Jinlei Wan, Tai Song, Wangchao Hou
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Electronics
Subjects:
integrated circuit test
cost reduction
adaptive test
naive Bayesian model
fast correlation-based filter
Online Access:https://www.mdpi.com/2079-9292/10/6/680

Internet

https://www.mdpi.com/2079-9292/10/6/680

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