Impact ionization by hot carriers in a black phosphorus field effect transistor

Carrier multiplication processes based on new electron-hole pair generation is instrumental to realizing ultrafast and efficient optoelectronic devices. Here, the authors demonstrate multilayered black phosphorous-based transistors that show enhanced performance due to carrier multiplication.

Bibliographic Details
Main Authors: Faisal Ahmed, Young Duck Kim, Zheng Yang, Pan He, Euyheon Hwang, Hyunsoo Yang, James Hone, Won Jong Yoo
Format: Article
Language:English
Published: Nature Publishing Group 2018-08-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-018-05981-0