Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2

Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2

The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nano...

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Bibliographic Details
Main Authors: Yue Niu, Sergio Gonzalez-Abad, Riccardo Frisenda, Philipp Marauhn, Matthias Drüppel, Patricia Gant, Robert Schmidt, Najme S. Taghavi, David Barcons, Aday J. Molina-Mendoza, Steffen Michaelis de Vasconcellos, Rudolf Bratschitsch, David Perez De Lara, Michael Rohlfing, Andres Castellanos-Gomez
Format: Article
Language:English
Published: MDPI AG 2018-09-01
Series:Nanomaterials
Subjects:
2D materials
transition metal dichalcogenides (TMDCs)
MoS2
MoSe2
WS2
WSe2
optical properties
differential reflectance
Online Access:http://www.mdpi.com/2079-4991/8/9/725

Internet

http://www.mdpi.com/2079-4991/8/9/725

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