A Paired Learner-Based Approach for Concept Drift Detection and Adaptation in Software Defect Prediction

The early and accurate prediction of defects helps in testing software and therefore leads to an overall higher-quality product. Due to drift in software defect data, prediction model performances may degrade over time. Very few earlier works have investigated the significance of concept drift (CD)...

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Bibliographic Details
Main Authors: Arvind Kumar Gangwar, Sandeep Kumar, Alok Mishra
Format: Article
Language:English
Published: MDPI AG 2021-07-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/11/14/6663