Floating Filler (FF) in an Indium Gallium Zinc Oxide (IGZO) Channel Improves the Erase Performance of Vertical Channel NAND Flash with a Cell-on-Peri (COP) Structure

In this study, we developed a V-NAND with an improved IGZO-P type (IP) floating filler (FF) structure based on an IGZO channel verified in previous studies and demonstrated that it has a very fast erase speed through device simulation. The proposed FF structure can supply holes generated through the...

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Bibliographic Details
Main Authors: Seonjun Choi, Changhwan Choi, Jae Kyeong Jeong, Myounggon Kang, Yun-heub Song
Format: Article
Language:English
Published: MDPI AG 2021-06-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/10/13/1561